Vibration table suitable for automotive components, electronic components, components, medicine, food, furniture, gifts, ceramics, packaging and other industries laboratory and production line on the samples of the relevant vibration test. Such as environmental acceptance test, quality identification test, reliability test, endurance test, vibration simulation analysis, material characteristic test, fatigue test, vibration prevention improvement, etc.. Simulation of products in the manufacturing, assembly, transport and use of the process The vibration suffered, to assess its structural vibration resistance, reliability and integrity。
型號 Model | F/ZW-TF(X & Y) | F/ZD-TF(XY) | F/ZW-TF(XYZ) |
電源 power supply | AC 2200V 50HZ |
性能 參數 | 頻率范圍 Frequency range | 1HZ~600HZ |
位移/振幅Position Shift amplitude | 0~5mm |
加速度Acceleration | 10g約（100m/s2）20g（200m/s2） |
振動(dòng)方向Vibration direction | 垂直 水平 前后 （X+Y+Z） |
振動(dòng)波形Vibration waveform | 全波/半波full wave /Half wave |
時(shí)間控制Time control | 任何時(shí)間可設（單位秒）Any time can be set (unit seconds) |
精密度Precision degree | 頻率可顯示到0.01HZ,J精密度0.1HZ Frequency can be displayed J, 0.01HZ precision 0.1HZ |
設備特點(diǎn) | 調頻功能 Adjust frequency function | 1-600HZ范圍內可任意設定試驗頻率 1-600HZ range can be arbitrarily set test frequency |
可程式功能 Programmable function | 1-600HZ頻率范圍內可將不同的固定頻率計時(shí)分段編程試驗（共15段） 1-600HZ frequency range can be segmented programming test (a total of 15 sections) |
掃頻功能 Sweep frequency function | 1-600HZ頻率范圍可任意設定上限頻率，下限頻率及周期時(shí)間，進(jìn)行循環(huán)掃頻試驗 1-600HZ frequency range can be arbitrarily set the upper limit frequency, lower limit frequency and cycle time, cyclic sweep frequency test |
倍頻功能 Frequency doubling function | 1-600HZ頻率范圍內可任意設定從低頻到高頻，頻率可自動(dòng)成倍進(jìn)行循環(huán) 1-600HZ frequency range can be arbitrarily set from low frequency to high frequency, frequency can be automatic cycle |
對數功能 Logarithm function | 1-600HZ頻率范圍內從低頻到高頻或從高頻到低頻，頻率成對數的形式循環(huán)試驗 1-600HZ frequency range from low frequency to high frequency or from high frequency to low frequency, frequency into the form of a logarithmic cycle test |
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